Design For Testability

Design For Testability

ASIC Design Solution

Design For Testability

Core 1

Comprehensive DFT Solution

Core 2

Optimized Test Coverage and Fault Detection

Core 3

From DFT Planning to Silicon Validation

Overview

Comprehensive
DFT Solution

Alphachips delivers comprehensive DFT solutions throughout the entire development lifecycle, from early design planning to production validation, ensuring high-quality semiconductor products. Leveraging advanced DFT technologies and proven methodologies, we help customers maximize test coverage, reduce test costs, enhance product reliability, and achieve successful production ramp-up.
ASIC Business Flow

Core Strengths & Capabilities

Alphachips delivers a complete front-end ASIC design flow, covering architecture, RTL development, verification, SoC integration, and performance optimization. Our proven methodologies support reliable and efficient semiconductor development from concept to implementation.
Advanced DFT Methodology

  • Proven DFT Methodology
  • High Fault Coverage Optimization
  • Test Cost Reduction
Memory Test Solution

  • MBIST Architecture Design
  • Memory Repair Support
  • SRAM / Embedded Memory Test
  • Yield Improvement Methodology
Functional Safety DFT

  • Comprehensive Verification
  • ISO 26262-aware DFT Methodology
  • Safety Mechanism Verification
  • Reliability-oriented Test Strategy
Power-aware DFT

  • Low Power DFT Architecture
  • Scan Power Optimization
  • Power-aware ATPG
  • IR-aware Test Strategy
Production Quality Enhancement

  • Manufacturing Yield Improvement
  • Defect Reduction Strategy
  • Test Time Optimization
  • Stable Mass Production Support
Solution

DFT & Test Engineering Solutions

We deliver end-to-end DFT solutions that optimize test architecture, improve fault coverage, and ensure efficient and reliable SoC validation across complex designs.

Scan Architecture

We design optimized Scan Architectures to achieve high test quality and fault coverage.
Core Capabilities
  • Scan Architecture Design
  • Scan Insertion
  • Compression Architecture
  • Scan Chain Optimization
  • Scan Verification

MBIST

We provide MBIST solutions to ensure memory quality and manufacturing yield.
Core Capabilities
  • MBIST Architecture Design
  • Memory Test Algorithm
  • Memory Repair Support
  • Yield Enhancement
  • MBIST Verification

SCAN/SSN (Streaming Scan Network)

We provide Tessent SSN solutions to dramatically reduce test time and data volume for SoC designs through streaming scan architecture.
Core Capabilities
  • SSN Architecture Design
  • Streaming Interface Integration
  • Test Data Volume Reduction
  • Multi-core Parallel Test
  • ATE Bandwidth Optimization

ATPG

We provide ATPG solutions to achieve high fault coverage and test efficiency.
Core Capabilities
  • ATPG Pattern Generation
  • Fault Coverage Analysis
  • Stuck-at Fault Testing
  • Transition Fault Testing
  • Bridging Fault Testing
  • Pattern Optimization

JTAG & Boundary Scan

We provide JTAG and Boundary Scan solutions for debugging and board-level testing.
Core Capabilities
  • IEEE 1149.1 Support
  • JTAG Implementation
  • Boundary Scan Design
  • Board-level Test Support
  • Debug Interface Design

DFT Verification

We verify DFT structures to ensure implementation quality and reliability.
Core Capabilities
  • DFT Simulation
  • Pattern Verification
  • Equivalence Check
  • DFT STA
  • Coverage Analysis

Functional Safety DFT

We provide DFT solutions for automotive and safety-critical applications.
Core Capabilities
  • Functional Safety Support
  • ISO 26262 Methodology
  • Safety-aware DFT Design
  • In-system Test Strategy
  • Reliability Verification
Design Applications

Supported Applications

Key benefits include high test coverage, reduced test cost, improved product quality, enhanced manufacturing yield, automotive-ready DFT solution.

AI SoC

Automotive SoC

Consumer Electronics

High-performance Computing

Industrial Semiconductor