Alphachips delivers comprehensive DFT solutions throughout the entire development lifecycle, from early design planning to production validation, ensuring high-quality semiconductor products. Leveraging advanced DFT technologies and proven methodologies, we help customers maximize test coverage, reduce test costs, enhance product reliability, and achieve successful production ramp-up.
ASIC Business Flow
Core Strengths & Capabilities
Alphachips delivers a complete front-end ASIC design flow, covering architecture, RTL development, verification, SoC integration, and performance optimization. Our proven methodologies support reliable and efficient semiconductor development from concept to implementation.
Advanced DFT Methodology
Proven DFT Methodology
High Fault Coverage Optimization
Test Cost Reduction
Memory Test Solution
MBIST Architecture Design
Memory Repair Support
SRAM / Embedded Memory Test
Yield Improvement Methodology
Functional Safety DFT
Comprehensive Verification
ISO 26262-aware DFT Methodology
Safety Mechanism Verification
Reliability-oriented Test Strategy
Power-aware DFT
Low Power DFT Architecture
Scan Power Optimization
Power-aware ATPG
IR-aware Test Strategy
Production Quality Enhancement
Manufacturing Yield Improvement
Defect Reduction Strategy
Test Time Optimization
Stable Mass Production Support
Solution
DFT & Test Engineering Solutions
We deliver end-to-end DFT solutions that optimize test architecture, improve fault coverage, and ensure efficient and reliable SoC validation across complex designs.
Scan Architecture
We design optimized Scan Architectures to achieve high test quality and fault coverage.
Core Capabilities
Scan Architecture Design
Scan Insertion
Compression Architecture
Scan Chain Optimization
Scan Verification
MBIST
We provide MBIST solutions to ensure memory quality and manufacturing yield.
Core Capabilities
MBIST Architecture Design
Memory Test Algorithm
Memory Repair Support
Yield Enhancement
MBIST Verification
SCAN/SSN (Streaming Scan Network)
We provide Tessent SSN solutions to dramatically reduce test time and data volume for SoC designs through streaming scan architecture.
Core Capabilities
SSN Architecture Design
Streaming Interface Integration
Test Data Volume Reduction
Multi-core Parallel Test
ATE Bandwidth Optimization
ATPG
We provide ATPG solutions to achieve high fault coverage and test efficiency.
Core Capabilities
ATPG Pattern Generation
Fault Coverage Analysis
Stuck-at Fault Testing
Transition Fault Testing
Bridging Fault Testing
Pattern Optimization
JTAG & Boundary Scan
We provide JTAG and Boundary Scan solutions for debugging and board-level testing.
Core Capabilities
IEEE 1149.1 Support
JTAG Implementation
Boundary Scan Design
Board-level Test Support
Debug Interface Design
Design ServicDFT Verificatione
We verify DFT structures to ensure implementation quality and reliability.
Core Capabilities
DFT Simulation
Pattern Verification
Equivalence Check
DFT STA
Coverage Analysis
Functional Safety DFT
We provide DFT solutions for automotive and safety-critical applications.
Core Capabilities
Functional Safety Support
ISO 26262 Methodology
Safety-aware DFT Design
In-system Test Strategy
Reliability Verification
Design Applications
Supported Applications
Key benefits include high test coverage, reduced test cost, improved product quality, enhanced manufacturing yield, automotive-ready DFT solution.
